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飛馳(北京)科學儀器有限公司

化工儀器網>產品展廳>物理特性分析儀器>粒度儀>激光粒度儀> 超高速智能粒度分析儀

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超高速智能粒度分析儀

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真理光學儀器有限公司專注于Gao端顆粒表征儀器的研發和制造,產品涵蓋激光(衍射法)粒度分析儀、動態光散射納米粒度及Zeta電位分析儀以及顆粒圖像分析儀,既有實驗室儀器,又有在線檢測系統。真理光學秉持“科學態度,工匠精神”,為用戶提供世界Xian進的Gao端產品和服務。

真理光學匯集了以張福根博士為代表的全國顆粒表征領域的頂尖人才。張福根博士現任本公司董事長兼首Xi科學家,還擔任全國顆粒表征及分檢與篩網標準化技術委員會副主任委員、天津大學兼職教授,曾擔任中國顆粒學會副理事長,同時也是“歐美克”字號公司的創始人。曾擔任英國某粒度儀器公司中國總經理20余年的秦和義先生擔任本公司商務總經理,中國顆粒學會青年理事潘林超博士、陳進博士擔綱公司的研發主力。

激光(衍射法)粒度儀雖然已得到廣泛應用,但它并不Wan美,不論是科學基礎方面,還是技術方案方面。真理光學的團隊針對當前市面上儀器存在的不足,展開了系統的理論研究和技術創新,發現了衍射光斑(愛里斑)的反常變化現象(ACAD),解釋了為什么不能測量3μm左右的聚苯乙烯微球,并給出了反常區(不能測量粒徑)的一般公式;研究了衍射儀器的測量上限和下限;研究了顆粒折射率偏差對測量結果的影響,發明了兩種根據散射光分布估算顆粒折射率的方法;提出了斜置梯形窗口技術方案(Zhuan利),解決了前向超大角測量盲區的問題,使衍射儀器的亞微米顆粒測量水平顯著提高;提出了統一的反演算法(專有技術),消除了不同計算模式給出不同結果的尷尬;設計出了高達20Kfps的超高速并行數據采樣電路,使干法測量的精度不亞于濕法測量,對高速噴霧場的測量(時間)分辨率也更高。

在納米粒度及Zeta電位儀方面,真理光學提出了比相位分析法(PALS)更先進的余弦擬合相位分析法(CF-PALS),用光纖分束取代了傳統的平板分束鏡分束,用光纖內光干涉取代了自由空間干涉,使Zeta電位的測量重復性大幅度提高。

Linkoptik Instruments specializes in the development and manufacture of high-end particle characterization instruments, including laser (diffraction) particle size analyzers, dynamic light scattering nano particle size and zeta potential analyzers, and particle image analyzers, both laboratory instruments and online inspection systems. Linkoptik Instruments upholds the "scientific attitude and craftsmanship" to provide customers with the world's advanced high-end products and services.

Linkoptik Instruments has gathered the top talents in the field of particle characterization in China, represented by Dr. Fugen Zhang. Dr. Zhang is the Chairman and Chief Scientist of our company, and is also the Vice Chairman of the National Technical Committee for Particle Characterization and Sieving and Sieve Standardization, a part-time professor of Tianjin University, and the Vice Chairman of the Chinese Particle Society. Mr. Qin He Yi, who was the general manager of a particle size instrument company in China for more than 20 years, is the commercial general manager of the company, and Dr. Pan Linchao and Dr. Chen Jin, the young directors of the Chinese Particle Society, are the main R&D team of the company.

Although laser (diffraction) particle size measurement has been widely used, it is not perfect, both in terms of scientific basis and technical solutions. The team at Truth Optics has conducted systematic theoretical research and technological innovation to address the shortcomings of the current instruments on the market, discovered the phenomenon of anomalous variation of diffraction spot (Airy spot) (ACAD), explained why polystyrene microspheres around 3 μm cannot be measured, and gave a general formula for the anomalous zone (not measuring particle size); studied the upper and lower measurement limits of diffraction instruments; studied the effect of particle The influence of refractive index deviation on the measurement results was studied, and two methods for estimating the refractive index of particles based on the scattered light distribution were invented; an oblique trapezoidal window technical solution (patented) was proposed, which solved the problem of the blind area of the forward oversized angle measurement and significantly improved the submicron particle measurement level of the diffraction instrument; a unified inversion algorithm (proprietary technology) was proposed, which eliminated the embarrassment of different calculation modes giving different results; the design of The ultra-high speed parallel data sampling circuit of up to 20Kfps has been designed, which makes the accuracy of dry measurement no less than that of wet measurement, and the measurement (time) resolution of high-speed spray field is also higher.

In nanometer particle size and zeta potential measurement, Linkoptik Instruments has proposed a more advanced cosine fitted phase analysis method (CF-PALS) than PALS, replacing the traditional flat beam splitter mirror beam splitting with fiber optic beam splitting, and replacing free space interference with optical interference inside the fiber, which has greatly improved the repeatability of zeta potential measurement.




專注于顆粒(包含粉體顆粒、乳膠顆粒和液體霧滴)測試技術的研發和儀器的生產銷售

  超高速智能粒度分析儀是通過顆粒的衍射或散射光的空間分布來分析顆粒大小的儀器,采用Furanhofer衍射及Mie散射理論,測試過程不受溫度變化、介質黏度,試樣密度及表面狀態等諸多因素的影響,只要將待測樣品均勻地展現于激光束中,即可獲得的測試結果。
  目前超高速智能粒度分析儀測試過程中都面臨一個遮光度的選擇,通俗來講遮光度就是在使用超高速智能粒度分析儀測試樣品時,配置的樣品懸浮液的濃度,遮光度的正確選擇是超高速智能粒度分析儀在粒度測試過程中的一個重要的步驟,遮光度是否合適或者說被測樣品的濃度是否合適嚴重關系到粒度測量結果的性和代表性。
  超高速智能粒度分析儀的測量原理要求在測試過程中,樣品的濃度以樣品中顆粒之間相互不發生二次散射為原則,理論上就是要求懸浮液或者空氣中顆粒之間的距離為顆粒直徑的3倍,但是這個要求非常難以掌握,因此在實際的粒度測試中,通過調整遮光比的數值來盡量顆粒之間不發生二次散射。遮光比不宜過大或者過小,遮光比過大時,顆粒的濃度過高,容易發生二次散射,測量結果誤差增大;遮光比過低,樣品中顆粒的濃度太低,顆粒數太少,測試結果的代表性很差,甚至可能導致測試結果是無效的,因此在測試過程中,對遮光比的選取要通過反復試驗,以得到正確的測量結果。
  一般來說,對于比較粗的樣品,遮光比可以選擇的比較高,如10~20%,正常情況可以為5~20%;對于超細的樣品,可以適當降低樣品的遮光比,但一般不要超過40%,這些都是實驗得到的經驗數值,但還需通過反復實驗,找到對應樣品測試時遮光比的*數值。
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