Helios 5 Laser PFIB System
- 公司名稱 賽默飛世爾科技（中國）有限公司
- 品牌 FEI/賽默飛
- 型號
- 產地
- 廠商性質 生產廠家
- 更新時間 2025/1/3 13:35:04
- 訪問次數 35
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欲了解更多信息，請瀏覽公司網站：www.thermofisher.com 賽默飛世爾科技中國簡介賽默飛世爾科技進入中國發展已超過35年，在中國的總部設于上海，并在北京、廣州、香港、成都、沈陽、西安、南京、武漢、昆明等地設立了分公司，員工人數約為5000名。我們的產品主要包括分析儀器、實驗室設備、試劑、耗材和軟件等，提供實驗室綜合解決方案，為各行各業的客戶服務。為了滿足中國市場的需求，現有7家工廠分別在上海、北京、蘇州和廣州等地運營。我們在全國還設立了8個應用開發中心以及示范實驗室，將世界級的前沿技術和產品帶給中國客戶，并提供應用開發與培訓等多項服務；擁位于上海的中國創新中心，擁有有100多位專業研究人員和工程師及70多項專利。創新中心專注于針對垂直市場的產品研究和開發，結合中國市場的需求和國外先進技術，研發適合中國的技術和產品；我們擁有遍布全國的維修服務網點和特別成立的中國技術培訓團隊，在全國有超過2600名專業人員直接為客戶提供服務。我們致力于幫助客戶使世界更健康、更清潔、更安全。
欲了解更多信息，請登錄網站：www.thermofisher.com 全國服務熱線：021-61621892公司電子郵箱：sales.china@thermofisher.com
科學儀器
Helios 5 Laser PFIB System
FIB SEM laser tool for high throughput millimeter scale cross sectioning and 3D characterization with nanometer resolution
The Thermo Scientific Helios 5 Laser PFIB System combines the best-in-class monochromated Elstar Scanning Electron Microscopy (SEM) Column with a plasma focused ion beam (PFIB) and a femtosecond laser to produce a high-resolution imaging and analysis tool with in-situ ablation capability, offering unprecedented material removal rates for fast millimeter-scale characterization at nanometer resolution.
Key Features
Fast material removal
Millimeter-scale cross sections with up to 15,000x faster material removal than a typical gallium focused ion beam.
Accurate and repeatable cut placement
The same coincident point for all 3 beams (SEM/PFIB/laser) enables accurate and repeatable cut placement and 3D characterization.
High throughput processing of challenging materials
Includes non-conductive or ion-beam-sensitive samples.
Shares all capabilities of the Helios 5 PFIB platform
High-quality gallium-free TEM and APT sample preparation and high-resolution imaging capabilities.
Statistically relevant subsurface and 3D data analysis
Acquire data for much larger volumes within a shorter amount of time.
Fast characterization of deep subsurface features
Extraction of subsurface TEM lamella or chunks for 3D analysis.
Fast and easy characterization of air-sensitive samples
No need to transfer samples between different instruments for imaging and cross-sectioning.
Specifications
| Femtosecond-laser specifications | ||
|---|---|---|
| Laser integration |
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| Laser Output | ||
| First Harmonic |
| 1030 nm (IR) |
| <280 fs | |
| Second Harmonic |
| 515 nm (green) |
| <300 fs | |
| Optics | ||
| Coincident point |
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| Objective lens |
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| Polarization |
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| Repetition rate |
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| Position accuracy |
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| Protective shutter |
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| Software |
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| Safety |
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