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Scanning Capacitance Microscopy (SCM) is a nanoelectrical imaging technique available on Cypher and Jupiter XR atomic force microscopes that uses a microwave radio frequency (RF) signal to map electric charge carrier locations, dopant levels, and dopant types (p-type vs. n-type) in semiconductors and other samples. The newly designed Asylum Research SCM accessory offers significantly higher performance and capability than any other currently available SCM module. Benefits include: 詢價(jià) ......