2011 年度 R&D 100 大獎獲得者。采用 Thermo Scientific™ Evolution 201 和 220 紫外-可見光分光光度計進行分析，擴展了實驗室的應用范圍，并提高了生產率。新一代 Thermo Scientific™ INSIGHT™ 軟件可同時應用于平板電腦和計算機控件，確保您的儀器緊跟技術潮流，并隨時應對新的樣品挑戰。我們的自定義用戶環境（CUE）軟件允許您*

【詳細說明】

貨號

產品規格

類型

840-210800

Each

Evolution 201 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords

完整參數 ▼

產品規格	Each
準確度（光度）	0.5: ±0.004; 1: ±0.006; 2: ±0.010; Measured at 440nm using neutral density filters traceable to NIST™
基線平坦度	±0.0010A, 200-800nm, 1.0nm SBW, smoothing
射束幾何形狀	Double-beam
認證/合規	ISO 9001:2008
連接	USB or RS-232
Data Interval	10, 5, 2, 1.0, 0.5, 0.2, 0.1nm
描述	Cutting-edge instrumentation, intuitive and powerful software, and a wide range of accessories consistently deliver high quality results and improved productivity.
檢測器類型	Dual Silicon Photodiodes
Dimensions (L x W x H)	62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in)
顯示	None
漂移	<0.0005A/hr, 500 nm, 1.0 nm SBW, 1 hr warm-up
Electrical Requirements	100-240V 50-60Hz, selected automatically, 150W maximum
物品描述	Evolution 201 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
燈	Xenon Flash Lamp, 3 year warranty (7 years typical lifetime)
噪聲	0A: <0.00015A; 1A:<0.00025A; 2A: <0.00080A; 260 nm, 1.0 nm SBW, RMS
操作系統	Microsoft Windows 7, Windows 8
光學設計	Double Beam with sample and reference cuvette positions; Czerny-Turner Monochromator
路徑長度（公制）	Up to 100 mm cuvettes
Pharmacopoeia Compliance Testing	Photometric Accuracy (60mg/L K2Cr2O7): ±0.010A Stray Light: ≤1%T at 198 nm: KCI; ≤0.05%AT at 220 nm: Nal, Kl Wavelength Accuracy: ±.5 nm 541.9, 546.1nm Hg emission lines, ±0.8 nm full range Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1 nm Hg emission line
Photometric Accuracy Instrument	1A: ±0.006A 2A: ±0.010A Measured at 440 nm using calibrated neutral density filters traceable to NIST
Photometric Display	-0.3 to 4.0A
Photometric Range	>3.5A
Photometric Repeatability	±0.0002A
Scan Ordinate Modes	Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R). log (Abs) Abs*, Intensity
掃描速度.	<1-6000 nm/min, variable
光譜帶寬	1.0 nm
類型	Evolution 201 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
瓦數	150W max.
波長精度	±0.5 nm (541.9, 546.1 nm mercury lines); ±0.8 nm (full range 190 to 1100 nm)
波長范圍	190 to 1100 nm
波長重復性	≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
波長掃描速度	<1 to 6000; variable
重量（英制）	32 lb
重量（公制）	14.4 kg

840-210600

Each

Evolution 220 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords

完整參數 ▼

產品規格	Each
基線平坦度	±0.0010A, 200-800 nm, 1.0nm SBW, smoothing
Data Interval	10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
描述	Cutting-edge instrumentation, intuitive and powerful software, and a wide range of accessories consistently deliver high quality results and improved productivity
檢測器類型	Dual Silicon Photodiodes
Dimensions (L x W x H)	62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in)
顯示	None
漂移	<0.0005A/hr, 500nm, 1.0nm SBW, 1 hr warm-up
Electrical Requirements	100-240V 50-60Hz, selected automatically, 150W maximum
物品描述	Evolution 220 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
鍵盤	Sealed membrane
燈	Xenon Flash Lamp, 3 year warranty (7 years typical lifetime)
噪聲	0A: <0.00015A; 1A: <0.00025A; 2A: <0.00080A; 260 nm, 1nm SBW, RMS
操作系統	Microsoft Windows 7, Windows 8
光學設計	Double Beam with sample and reference cuvette positions; Application Focused Beam Geometry; Czerny-Turner Monochromator
Pharmacopoeia Compliance Testing	(Guaranteed Performance Specifications) Resolution (toluene in Hexane): ≥1.8A Photometric Accuracy (60 mg/L K₂Cr₂O₇): ±0.010A Stray Light: ≤1%T at 198 nm: KCI; ≤ to 0.05 %AT at 220nm: Nal, Kl Wavelength Accuracy: ±0.5 nm 541.9, 546.1 nm Hg emission lines, ±0.8 nm full range Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1nm Hg emission line
Photometric Accuracy Instrument	1A: ±0.006A 2A: ±0.010A Measured at 440 nm using calibrated neutral density filters traceable to NIST
Photometric Display	-0.3 to 4.0A
Photometric Range	>3.5A
Photometric Repeatability	±0.0002A
Scan Ordinate Modes	Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
掃描速度.	<1-6000nm/min, variable
光譜帶寬	Variable: 1.0nm; 2.0nm; AFBG Microcell optimized; AFBG Fiber optic optimized; AFBG Materials optimized
類型	Evolution 220 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
波長精度	±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
波長范圍	190 to 1100 nm
波長重復性	≤0.05nm (546.11nm mercury line, SD of 10 measurements)
重量（英制）	32 lb
重量（公制）	14.4 kg


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